Fernando Augusto Zamora Montoya
Certificate of Attendance
took part successfully in the following webinar of the Wiley Analytical Science Spring 2022 Conference:
Get Maximum Throughput and Artifact-free Surfaces by Using High Current Plasma FIB-SEM for Sample Characterization
April 26, 5:00 - 6:00 PM CEST
Issued to
Fernando Augusto Zamora Montoya
Want to report a typo or a mistake?
Credential Verification
Issue date: May 18, 2022
ID: afdfdb1f-3d11-461a-9bf8-3234bc2552b3
Issued by
Wiley Virtual Events
Description
No information provided for this award.