Yueling Qin
Certificate of Attendance
took part successfully in the following webinar of the Wiley Analytical Science Spring 2022 Conference:
Get Maximum Throughput and Artifact-free Surfaces by Using High Current Plasma FIB-SEM for Sample Characterization
April 26, 5:00 - 6:00 PM CEST
Issued to
Yueling Qin
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Credential Verification
Issue date: May 18, 2022
ID: 4f3ee6a8-ed84-4c39-b536-65bceee51a69
Issued by
Wiley Virtual Events
Description
No information provided for this award.